XRF Film Thickness Spectrometer/Coating Film Thickness Gauge/Non-destructive Alloy Composition Analyzer
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XRF Film Thickness Spectrometer/Coating Film Thickness Gauge/Non-destructive Alloy Composition Analyzer
Brand Name :LONROY
Place of Origin :Guangdong, China
customized support :OEM, ODM, OBM
warranty :1year
Model Number :LR-1610D
Product name :Coating thickness gauge
MOQ :1
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XRF film thickness spectrometer/Coating film thickness gauge/Non-destructive alloy composition analyzer
1.Product introduction:
LR-1610D spectral thickness gauge can analyze the plating solution while analyzing the thickness of various coatings.It is applicable to super large pieces,heterosexual groove pieces,micro intensive multi-point testing or automatic detection of a large number of small parts one by one,such as print circuit boards(PCB),lead supports, sanitary products,etc
2.Feature
Automatic Programmable automatic displacement platform, unattended ,automatic sample detection;High efficiency detection of hundreds of sample points can be realized with one program Intelligent Realize automatic Al image intelligent searching,and program files to automatically match test positions. It has obvious advantages in the face of testing large quantities of similar samples. Online According to customer needs, online inspection of production line can be customized to provide an overall solution for online inspection for Industry 4.0, improve inspection efficiency and realize automatic intelligent factory.
XRF film thickness spectrometer/Coating film thickness gauge/Non-destructive alloy composition analyzer
3.characteristic
1.Reliable high performance High test accuracy and stability, reduce waste and eliminate dead time while providing high quality
2.Cost-effective Manufacturing process upgrade, more cost-effective, greatly saving use costs
3.Advanced detection technology Highly integrated vertical optical path system,using advanced spectrum analysis technology and image recognition algorithm, realizes accurate, fast, intelligentand automatic detection to meet theneeds of enterprises
4.Longerservice life Modular design, focusing on energy saving, and equipped with automatic sleep mode to extend the servicelife
5.Core EFP algorithm Theadvanced EFP algorithm is not only accuratefor multi-layertesting and convenient for calibration, but also solves the detection problems of multi-ayeralloy, upperand lowerelement repeated coatingand penetration layer
6.Four-Focus integrated device Equipped with highly integrated fourfocal technology, it can measure the height and height ofthegroove with a maximum depth of90mm
7.Up-bottom optical Measure The division of management between the upperand lower computers enables fast, accurate,stable and efficient measurement ofsuper large workpieces
8.Strong applicability Accurately measure thethickness ofvarious metal coatings and analyze the plating solution
XRF film thickness spectrometer/Coating film thickness gauge/Non-destructive alloy composition analyzer
Model
Items
XD-1000
Product configuration
A
B
C
ElementAnalysis
Cl(17)-U(92)
S(16)/Al(13)-U(92)
Thickness-ElementAnalysis
Cl(17)/Li(3)-U(92)
L(3)-U(92)
EFP algorithm
standard
Thickness&Element Analysis ability
Simultaneous analysis of
5 coatings and 10 elements
Simultaneous analysis of 23 coatings and 24elements
Detection ofthe same
elementin different layers
standard
Software
User-friendly software, Easy-operation,Self-diagnoses system
X-ray Tube
Micro-focusingX-ray Tube
Micro-focusingenhanced
X-ray tube
Collimator
φ0.2mm
φ0.5mm,(One ofTwo)
φ0.2mm
(φ0.1mmCan beselected)
Standard;φ0.2mm;
φ0.5mmφ0.3mmφ0.2mm
φ0.1mm*φ0.3mm
Can be selected
Micro-Focusing Spot
Spot diffusivity 10%(in normal measuring distance)
Measuring Distance
Distance correction function, differentdistance sample can be tested in the same test condition,
0-90mm measuring distance
Sample observation
1/2.7"colorCCD,with zoom function
Focus mode
High sensitivity lens, manual focusing
Magnification
Optical 38-46x, digital amplification 40-200 times
Detector
High efficiency proportional counter
Standard:Si-PIN semiconductor detector(SDD can beoptional)
